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In the case of special purpose applications like RT or where there is vendor specific IP, they offer the ability to use the target FPGA for simulation. It offers simulation acceleration, emulation and physical prototyping. In the white paper Aldec describes their solution for hardware acceleration of simulation of FPGA based system – HES-DVM.
#Corner case for fpga simulation verification
Lastly, any debugging requires problem identification, fix implementation and verification which calls for the features found in HDL simulation. Constrained random testing usually needs massive amounts of simulation. On top of this there is the use of constrained random testing to catch difficult to find corner cases. As always there are regression tests that must be performed throughout the project lifetime. Also, IP cores which should be independently verified need to be simulated in-system to ensure proper integration. This is also when any potential discrepancies between gate level and RTL results are examined. Then comes post-synthesis simulation, which comes with much more simulation overhead. There is RTL simulation with all the necessary test benches. The Aldec paper covers each of the verification processes that must be addressed. Microchip’s PolarFire FPGA offers RT and their SmartFusion2 comes with an embedded ARM Cortex-M3. FPGAs, such as those from Microchip offer excellent solutions for these markets. Some of these markets have very specific requirements for reliability and radiation tolerance (RT). I will assume it is temperature inversion.Simulation AccelerationFPGA based systems are heavily used in aerospace, aviation, and automotive markets. Sorry Forum but that is the most important part of our anatomy and does show temperature inversion as wellĪlready I have a design in Arria10 that consistently shows recovery/removal failures at 0 but not at 100 for same other conditions. or may be google: dasdan-temperature.pdfĪs link is killed by this site due to bad name(di*k).
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****rp/talp/papers/dasdan-temperature.pdf I would say yes temperature inversion exists but is a new theme nowadays, look at this link: But you can test at high and low temp, and at high and low operating voltage.Ĭommercial product developers (of which I was one) routinely do this multiple corner testing as part of the DVT (design validation test) process prior to volume manufacturing. Unless you are a high volume corporate customer of Altera's you won't ever be able to get 'fast' and 'slow' process corner parts (other than selecting -6 or -8 speed grades yourself). And then use a slow process part running at high temperature and minimum operating voltage. So to robustly test a design over all operating parameters, one might use a fast process part running at low temperature and maximum voltage. This is a characteristic of the CMOS process.Īgain holding the process constant and at a constant die temperature, the FPGA will run faster at a higher voltage than at a lower voltage (within the operating voltage limits of the design).Īnd lastly, for any fixed temperature and fixed voltage, there will be some FPGA die that run faster and some slower. Certainly true but depends heavily on device requirement relative to clock edge (if setup/hold are viewed from pin perspective)įor a given process corner (ie, holding the process factor constant) and fixed voltage the FPGA will run faster at 0'C than it does at 85'C. True but you actually mean a fast io register is more likely to support an external device setup requirement than meets its hold requirement.
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Depending on your application, that might be a bad or good thing, hence "best" is subjective.Ī "complete" timing analysis involves taking the worst-case timing parameters from all corner cases, and making sure your design meets timing for them all. This means that an external register capturing data from the fast model would have more setup time, and less hold time than the slow model. The signals from the fast model leave sooner than the fast model.
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If you take a look at the timequest.pdf document I posted to this thread,Īnd keep flipping between pages 38 and 39, you'll get a visualization of the difference between slow and fast timing models at the I/Os of an FPGA. It is more correctly the "Fast" model, i.e., the time delays are shortest.